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Autor(en):
Rebel, Jürgen N.; Wohlmuth, Hans-Dieter; Russer, Peter 
Titel:
Time Domain Characterization of Planar Microwave Transformers Using the SCN-TLM Method 
Abstract:
This paper describes the time domain characterization of planar microwave transformers for monolithic RF power amplifiers using the SCN-TLM method. The primary objective of this study is to determine the influence of losses on the electrical properties of such transformers. It emerges that the principle loss mechanism originates from conductor losses of the windings. The influence of the lossy silicon substrate can be neglected up to 5 GHz 
Stichworte:
1 to 5 GHz, conductor losses, electrical properties, losses, MMIC power amplifiers, monolithic RF power amplifiers, planar microwave transformers, planar waveguides, SCN-TLM method, time domain characterization, time-domain analysis, transmission line matrix methods, UHF integrated circuits, UHF power amplifiers 
Kongress- / Buchtitel:
IEEE MTT-S International Microwave Symposium 
Band / Teilband / Volume:
Verlagsort:
Boston, MA, USA 
Jahr:
2000 
Monat:
jun 
Seiten:
1109--1112