Lett., R. WeigElectron;Lettersm, A. HOptics;Meier, H.;Schneider, R.;Walliser, B.;Ruile, W.
FiElectron Lett.d Theory Analysis and ExperiMicroelectronic Engineering, Elsevierntal Characterization of Wave Propagation in Microacoustic Structures
PIERS 97, Hong Kong, 6.--9.1.97
1997