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- Author(s):
- Kaleve, Abraham; Sinnesbichler, Franz X.; Olbrich, Gerhard R.
- Title:
- 1/f-Noise Parameter Extraction for Advanced Semiconductor Devices
- Book / Congress title:
- 5th European IC-CAP User Meeting
- Publisher address:
- Marseille, France
- Year:
- 1999
- Month:
- jun
- Pages:
- 1--5
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