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- Title:
Simultaneous displacement and slope measurement in electronic speckle pattern interferometry using adjustable aperture multiplexing
- Document type:
- Zeitschriftenaufsatz
- Author(s):
- Lu, M.; Wang, S.; Aulbach, L.; Koch, A.W.
- Journal title:
- Applied Optics
- Year:
- 2016
- Journal volume:
- vol. 55
- Year / month:
- 2016-07
- Quarter:
- 3. Quartal
- Month:
- Jul
- Journal issue:
- no. 22
- Pages contribution:
- pp. 5868-5875
- Reviewed:
- ja
- Language:
- en
- Fulltext / DOI:
- doi:10.1364/AO.55.005868
- WWW:
- https://www.osapublishing.org/ao/abstract.cfm?uri=ao-55-22-5868
- Status:
- Verlagsversion / published
- Date of publication:
- 22.07.2016
- Semester:
- SS 16
- TUM Institution:
- Lehrstuhl für Messsystem- und Sensortechnik
- Ingested:
- 24.01.2017
- Last change:
- 24.01.2017
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