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Author(s):
Felgentreff, Tilmann; Olbrich, Gerhard R.; Russer, Peter 
Title:
Noise Parameter Modeling of HEMTs with Resistor Temperature Noise Sources 
Abstract:
We present a new model to describe the millimeter wave noise performance of MESFETs and HEMTs. The model is used to extrapolate the noise parameters in frequency range and to describe the noise behaviour over a wide range of bias points. The model is based on three uncorrelated noise sources located at the intrinsic transistor, which are assumed to show white spectral behaviour. The parameters of the model are determined from noise parameter measurements. The noise parameter extraction technique...    »
 
Keywords:
circuit simulation programs, equivalent circuits, HEMTs, high electron mobility transistors, MESFETs, millimeter wave noise performance, MM-wave FETs, noise parameter extraction technique, noise parameter modeling, pseudomorphic structures, resistor temperature noise sources, Schottky gate field effect transistors, semiconductor device models, semiconductor device noise, solid-state microwave devices, thermal noise, white noise, white spectral behaviour 
Book / Congress title:
IEEE MTT-S International Microwave Symposium 
Volume:
Publisher address:
San Diego, CA, USA 
Year:
1994 
Month:
may 
Pages:
853--856