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Author(s):
Thomann, Wolfgang; Russer, Peter 
Title:
Quasi-Simultaneous External Electrooptic Probing of Transverse and Longitudinal Field Distributions Taking into Account the Probe Tip Invasiveness 
Abstract:
A versatile electrooptic measurement setup facilitates the direct probing of circuits on electrooptic substrates and on arbitrary substrates by employing an external probe tip of a specific crystal-cut that allows the quasi-simultaneous probing of transverse and quasi-longitudinal electric field components. Employing the presented quasi-simultaneous measurements and the theoretical methods, the determined change in intensity of the transmitted laser beam can be used for the implementation of cor...    »
 
Keywords:
circuits, correction algorithms, coupled microstrip transmission lines, crystal-cut, electric field, electric field measurement, electrooptic substrates, electro-optical effects, external electrooptic probing, laser beam, longitudinal field distributions, measurement by laser beam, microstrip lines, microwave measurement, probe tip invasiveness, probes, quasi-simultaneous measurements, space-domain, time-domain, transverse field distributions 
Book / Congress title:
IEEE MTT-S International Microwave Symposium 
Volume:
Publisher address:
San Diego, CA, USA 
Year:
1994 
Month:
may 
Pages:
1601--1604