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- Author(s):
- Valenzuela, Alejandro A.; Sölkner, G.; Keßler, Jochen; Russer, Peter H.
- Title:
- Microwave Characterisation of Structured YBatextlesssubtextgreater2textless/subtextgreaterCutextlesssubtextgreater3textless/subtextgreaterOtextlesssubtextgreater7-δtextless/subtextgreater - Thin Films
- Journal title:
- Materials Science Forum
- Year:
- 1993
- Journal volume:
- 130-132
- Pages contribution:
- 349--372
- Fulltext / DOI:
- doi:10.4028/www.scientific.net/MSF.130-132.349
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