- Author(s):
- Nirmaier, T.; Zaguirre, J.T.; Hong, E.; Spirkl, W.; Rettenberger, A.; Schmitt-Landsiedel, D.
- Title:
- Efficient High-Speed Interface Verification and Fault Analysis
- Book / Congress title:
- Proc. IEEE International Test Conference ITC 2008
- Year:
- 2008
- Pages:
- 1--9
- Bookseries ISSN:
- 1089-3539
- BibTeX