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Author(s):
Nirmaier, T.; Zaguirre, J.T.; Hong, E.; Spirkl, W.; Rettenberger, A.; Schmitt-Landsiedel, D. 
Title:
Efficient High-Speed Interface Verification and Fault Analysis 
Book / Congress title:
Proc. IEEE International Test Conference ITC 2008 
Year:
2008 
Pages:
1--9 
Bookseries ISSN:
1089-3539