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Author(s):
Fischer, T.; Amirante, E.; Hofmann, K.; Ostermayr, M.; Huber, B.; Schmitt-Landsiedel, D. 
Title:
Test structures for SRAM cell and device variability and the �statistics of NBTI degradation 
Book / Congress title:
Workshop on Variation Test Structures at ICCAD 
Year:
2008 
Month:
13. Nov.