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Document type:
Zeitschriftenaufsatz 
Author(s):
Fischer, Thomas; Amirante, Ettore; Huber, Peter; Nirschl, Thomas; Olbrich, Alexander; Ostermayr, Martin; Schmitt-Landsiedel, Doris 
Title:
Analysis of read current and write trip voltage variability from a 1 MBit SRAM test structure 
Journal title:
IEEE Transactions on Semiconductor Manufacturing 
Year:
2008 
Journal volume:
21 
Journal issue:
Language:
en 
TUM Institution:
Lehrstuhl für Technische Elektronik 
Format:
Text