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Author(s):
Tabacaru, Bogdan Andrei; Chaari, Moomen; Ecker, Wolfgang; Kruse, Thomas; Novello, Cristiano 
Title:
{Speeding up Safety Verification by Fault Abstraction and Simulation to Transaction Level} 
Journal title:
IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) 
Year:
2016 
Pages contribution:
1--6