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Author(s):
Tabacaru, Bogdan Andrei; Chaari, Moomen; Ecker, Wolfgang; Kruse, Thomas; Novello, Cristiano 
Title:
{Gate-Level-Accurate Fault-Effect Analysis at Virtual-Prototype Speed} 
Journal title:
ERCIM/EWICS/ARTEMIS Workshop on ``Dependable Embedded and Cyber-physical Systems and Systems-of-Systems'' (DECSoS'16) 
Year:
2016 
Pages contribution:
1--13