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Author(s):
Habal, Husni; Graeb, Helmut 
Title:
A Step-Accurate Model for the Trapping and Release of Charge Carriers Suitable for the Transient Simulation of Analog Circuits 
Journal title:
Journal of Microelectronics Reliability 
Year:
2016 
Notes:
Available online 26 January 2016, ISSN 0026-2714, http://dx.doi.org/10.1016/j.microrel.2016.01.001.