4H-SiC pin diode, harsh environment electronics, magnetic field sensors; Magnetic Field; PIN Diodes; Microtesla; Measurement Noise; Harsh Environments; Wide Bandgap; Thermal Noise; Silicon Carbide; Wide Bandgap Semiconductor; Magnetic Noise; Magnetic Sensitivity; Magnetometer; Absolute Change; Device Fabrication; Temperature Sensor; Bias Voltage; Magnetic Measurements; Temperature Regi Relative Sensitivity; High Magnetic Field; Magnetic Field Sensors; Diode Current; Drift Current; Epitaxial Layer; Stacking Faults; Hall Sensor; Source Measure Unit; High Temperature Regime; Slow Drift; In-plane Magnetic Field; Okeil, H.; Wachutka, G.
«
4H-SiC pin diode, harsh environment electronics, magnetic field sensors; Magnetic Field; PIN Diodes; Microtesla; Measurement Noise; Harsh Environments; Wide Bandgap; Thermal Noise; Silicon Carbide; Wide Bandgap Semiconductor; Magnetic Noise; Magnetic Sensitivity; Magnetometer; Absolute Change; Device Fabrication; Temperature Sensor; Bias Voltage; Magnetic Measurements; Temperature Regi Relative Sensitivity; High Magnetic Field; Magnetic Field Sensors; Diode Current; Drift...
»