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Document type:
Zeitschriftenaufsatz 
Author(s):
Braun, A.; Briggs, K.M.; B̈oni, P. 
Title:
Analytical Solution to {{Matthews}}' and {{Blakeslee}}'s Critical Dislocation Formation Thickness of Epitaxially Grown Thin Films 
Abstract:
For the first time, an analytical expression for the critical thickness for the onset of misfit dislocations as established by Matthews and Blakeslee is presented. It is the so-called Lambert W function which reflects the curvature of this critical thickness. With the arrive of the analytical solution, expressions of arbitrary complexity that involve the critical thickness can be handled much more easily. Its practical application is demonstrated by implementation of Vegard's rule. r 2002 Publis...    »
 
Journal title:
Journal of Crystal Growth 
Year:
2002 
Journal volume:
241 
Month:
may 
Journal issue:
1-2 
Pages contribution:
231 
Language:
en 
Print-ISSN:
00220248