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Dokumenttyp:
Zeitschriftenaufsatz
Autor(en):
Braun, A.; Briggs, K.M.; B̈oni, P.
Titel:
Analytical Solution to {{Matthews}}' and {{Blakeslee}}'s Critical Dislocation Formation Thickness of Epitaxially Grown Thin Films
Abstract:
For the first time, an analytical expression for the critical thickness for the onset of misfit dislocations as established by Matthews and Blakeslee is presented. It is the so-called Lambert W function which reflects the curvature of this critical thickness. With the arrive of the analytical solution, expressions of arbitrary complexity that involve the critical thickness can be handled much more easily. Its practical application is demonstrated by implementation of Vegard's rule. r 2002 Publis...     »
Zeitschriftentitel:
Journal of Crystal Growth
Jahr:
2002
Band / Volume:
241
Monat:
may
Heft / Issue:
1-2
Seitenangaben Beitrag:
231
Sprache:
en
Volltext / DOI:
doi:10.1016/S0022-0248(02)00941-7
Print-ISSN:
00220248
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