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Author(s):
Li, Tianjian; Xie, Feng; Liang, Xiaoyao; Xu, Qiang; Chakrabarty, Krishnendu; Jing, Naifeng; Jiang, Li 
Title:
A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs 
Journal title:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 
Year:
2016 
Journal volume:
35 
Journal issue:
Pages contribution:
1192-1205 
Publisher:
Institute of Electrical and Electronics Engineers (IEEE) 
E-ISSN:
0278-00701937-4151 
Date of publication:
01.07.2016