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Document type:
Konferenzbeitrag 
Author(s):
Alyokhin, V.; Elbel, B.; Rothfelder, M.; Pretschner, A. 
Title:
Coverage Metrics for Continuous Function Charts 
Keywords:
testing, model, coverage 
Book / Congress title:
Proc. 15th IEEE Intl. Symp. on Software Reliability Engineering (ISSRE'04) 
Publisher:
Institute of Electrical & Electronics Engineers (IEEE) 
Year:
2004