Translated abstract:
In contrast to common Auger electron spectroscopy, positron-induced Auger electron spectroscopy (PAES) uses the annihilation of slow energy positrons with core electrons of the sample to initiate the Auger process. Due to the low energy of the implanted positrons (some 10 eV), no secondary electron background is produced in the higher energy range of released Auger electrons. Thus, PAES possesses a considerably higher signal-to-noise-ratio compared to conventional AES. Moreover, PAES is more surface-sensitive, since most of the implanted positrons annihilate with electrons of the topmost atomic layer.In the context of this work, a ß+-emitter-based positron beam and a PAES facility was constructed. The capability of the set-up was demonstrated by conventional and positron induced AES on polycrystalline copper.