Oxygen related defects and vacancy clusters identified in sputtering grown UOx thin films by positron annihilation techniques

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Document type:: Zeitschriftenaufsatz
Author(s):: Macchi, C.; Somoza, A.; Guimpel, J.; Suárez, S.; Egger, W.; Hugenschmidt, C.; Mariazzi, S.; Brusa, R.S.
Title:: Oxygen related defects and vacancy clusters identified in sputtering grown UOx thin films by positron annihilation techniques
Journal title:: Results in Physics
Year:: 2021
Journal volume:: 27
Pages contribution:: 104513
Fulltext / DOI:: doi:10.1016/j.rinp.2021.104513
Publisher:: Elsevier BV
E-ISSN:: 2211-3797
Date of publication:: 01.08.2021
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