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Document type:
Konferenzbeitrag 
Contribution type:
Textbeitrag / Aufsatz 
Author(s):
Rott, K.; Schmitt-Landsiedel, D.; Reisinger, H.; Rott, G.; Schlünder, G. GeoG. Georgakos.; Aresu, S.; Grasser, T. 
Title:
Impact and measurement of short term threshold instabilities in MOSFETs of analog circuits 
Book / Congress title:
International Integrated Reliability Workshop 
Year:
2012 
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