Knipper, U. ; Pfirsch, F. ; Raker, T. ; Niedermeyr, J. ; Wachutka, G.
Destruction in the Active Part of an IGBT Chip Caused by Avalanche-Breakdown at the Edge Termination Structure,
pp.159-162
7th International Conference on Advanced Semiconductor Devices and Microsystems - ASDAM ´08
12.10.2008 - 16.10.2008, Smolenice Castle, Slovakia
2008