Chyan, Oliver;Chan, Raymond;Arunagiri, Tiruchirapalli;Zhang, Yibin;Hurd, Trace
Electrochemistry and interfacial characterization of copper thin film on ruthenium and ruthenium oxide surfaces
Abstracts of Papers, 225th ACS National Meeting, New Orleans, LA, United States, March 23-27, 2003
2003
COLL-489