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Author(s):
Pfeiffer, Franz; Zhang, Wei; Robinson, Ian K. 
Title:
Coherent grazing exit x-ray scattering geometry for probing the structure of thin films 
Journal title:
Appl. Phys. Lett. 
Year:
2004 
Journal volume:
84 
Journal issue:
11 
Pages contribution:
1847 
Fulltext / DOI:
Publisher:
AIP Publishing 
Date of publication:
01.01.2004