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Autor(en):
Barth, C.; Hynninen, T.; Bieletzki, M.; Henry, C. R.; Foster, A. S.; Esch, F.; Heiz, U. 
Titel:
AFM tip characterization by Kelvin probe force microscopy 
Abstract:
Reliable detn. of the surface potential with spatial resoln. is key for understanding complex interfaces that range from nanostructured surfaces to mol. systems to biol. membranes. In this context, Kelvin probe force microscopy (KPFM) has become the at. force microscope (AFM) method of choice for mapping the local electrostatic surface potential as it changes laterally due to variations in the surface work function or surface charge distribution. For reliable KPFM measurements, the influence of...    »
 
Kongresstitel:
66 Surface Chemistry and Colloids Centre Interdisciplinaire de Nanoscience de Marseille (CINaM6 UPR 3118), CNRS, Marseille, Fr. Journal; Online Computer File 1367-2630 
Zeitschriftentitel:
New J. Phys. 
Jahr:
2010 
Band / Volume:
12 
Seitenangaben Beitrag:
No pp given