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Document type:
Zeitschriftenaufsatz 
Author(s):
Gustschin, N.; Gustschin, A.; Epple, F. M.; Allner, S.; Achterhold, K.; Herzen, J.; Pfeiffer, F. 
Title:
Signal-to-thickness calibration and pixel-wise interpolation for beam-hardening artefact reduction in microCT 
Abstract:
X-ray computed tomography (CT) reconstruction suffers from beam-hardening artefacts caused by the polychromaticity of virtually all lab-based X-ray sources. A method to correct for beam-hardening is a direct, pixel-wise signal-to-thickness calibration (STC). We compare reconstructions of conventionally flat-field corrected as well as STC preprocessed measurements of various samples performed on a commercial microCT device based on a flat-panel detector. We show that a good estimate between the t...    »
 
Journal title:
EPL (Europhysics Letters) 
Year:
2019 
Journal volume:
125 
Journal issue:
Pages contribution:
38003 
Reviewed:
ja 
Language:
en 
Publisher:
IOP Publishing 
E-ISSN:
1286-4854 
Accepted:
30.01.2019 
Date of publication:
07.03.2019