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Document type:
Zeitschriftenaufsatz 
Author(s):
Senthil Kumar, M.; B̈oni, P.; Clemens, D. 
Title:
Interface Roughness in {{Ni}}/{{Ti}} Multilayers as Probed by Neutrons 
Abstract:
The development of interface roughness in reactively sputtered Ni/Ti multilayers is investigated by neutron re#ectivity measurements. The re#ectivity data of supermirrors show that the interface roughness of the layers is considerably reduced by reactive sputtering. But the degree of interdi!usion appears to remain the same. Samples prepared at various partial pressures of air clearly demonstrate that a minimum partial pressure of air is su\$cient to obtain smooth interfaces. A drastic decrease...    »
 
Journal title:
Physica B: Condensed Matter 
Year:
2000 
Journal volume:
276-278 
Month:
mar 
Pages contribution:
142 
Language:
en 
Print-ISSN:
09214526