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Document type:
Konferenzbeitrag 
Author(s):
Doncov, N.; Stosic, B.; Stankovic, Z.; Russer, J.; Haider, M.; Baharuddin, M.H.; Thomas, D.W.P. 
Title:
Characterization of EM field above a single aperture or air-vents of an enclosure for a variable degree of correlation between stochastic sources inside 
Abstract:
In this paper, an electromagnetic field distribution above a single aperture or an array of apertures (so-called air-vent) of a metal enclosure with two monopole sources inside is considered. Based on the previously developed approach that uses the S-parameter description of a multi-port network model of sources and near-field probes, incorporated into the correlation matrix calculation, the electromagnetic field above the aperture is characterized for a variable degree of correlation between co...    »
 
Keywords:
Apertures, Correlation, Probes, Stochastic processes, Electromagnetic compatibility, Numerical models, Scattering parameters 
Book / Congress title:
Electromagnetics in Advanced Applications (ICEAA), 2017 International Conference on 
Congress (additional information):
Verona, Italy, 11-15 Sep 2017 2017-09 
Publisher:
IEEE Xplore Digital Library 
Year:
2017 
Quarter:
3. Quartal 
Year / month:
2017-09 
Month:
Sep 
Language:
en