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Document type:
Zeitschriftenaufsatz
Author(s):
Wörle, Martin; Holleitner, Alexander W.; Kienberger, Reinhard; Iglev, Hristo
Title:
Ultrafast hot-carrier relaxation in silicon monitored by phase-resolved transient absorption spectroscopy
Journal title:
Physical Review B
Year:
2021
Journal volume:
104
Journal issue:
4
Fulltext / DOI:
doi:10.1103/physrevb.104.l041201
Publisher:
American Physical Society (APS)
E-ISSN:
2469-99502469-9969
Date of publication:
12.07.2021
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