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- Title:
Effects of the compliance current on the switching of HfO2 and Al:HfO2 memristive devices: characterization and modeling
- Document type:
- Konferenzbeitrag
- Author(s):
- Maldonado, D.; Reddy, K. Dorai Swamy; Pechmann, S.; Hagelauer, A.; Wenger, Ch.; Roldán, J.B.; Pérez, E.
- Keywords:
- Performance evaluation; Analytical models; Statistical analysis; Shape; Shape measurement; Semiconductor device reliability; Switches; Tin; Semiconductor process modeling; Dielectrics
- Book / Congress title:
- 2025 15th Spanish Conference on Electron Devices (CDE)
- Year:
- 2025
- Pages:
- 1-4
- Fulltext / DOI:
- doi:10.1109/cde66381.2025.11038898
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