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- Author(s):
- Pfeiffer, F.; Bunk, O.; Schulze-Briese, C.; Diaz, A.; Weitkamp, T.; David, C.; van der Veen, J. F.; Vartanyants, I.; Robinson, I. K.
- Title:
- Shearing Interferometer for Quantifying the Coherence of Hard X-Ray Beams
- Journal title:
- Phys. Rev. Lett.
- Year:
- 2005
- Journal volume:
- 94
- Journal issue:
- 16
- Fulltext / DOI:
- doi:10.1103/physrevlett.94.164801
- Publisher:
- American Physical Society (APS)
- Date of publication:
- 26.04.2005
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