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- Author(s):
- Malecki, Andreas; Eggl, Elena; Schaff, Florian; Potdevin, Guillaume; Baum, Thomas; Garcia, Eduardo Grande; Bauer, Jan S.; Pfeiffer, Franz
- Title:
- Correlation of X-Ray Dark-Field Radiography to Mechanical Sample Properties
- Journal title:
- Microscopy and Microanalysis
- Year:
- 2014
- Journal volume:
- 20
- Journal issue:
- 05
- Pages contribution:
- 1528-1533
- Fulltext / DOI:
- doi:10.1017/s1431927614001718
- Publisher:
- Cambridge University Press (CUP)
- Date of publication:
- 01.07.2014
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