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Title:

Evaluation of LDMOS Device's Behavior at Cryogenic Temperatures

Document type:
Konferenzbeitrag
Author(s):
Zahra, Mohammad Abu; Repp, Jens; Hartmann, Michael; Brandl, Matthias; Brederlow, Ralf
Pages contribution:
181-184
Book / Congress title:
2024 International Semiconductor Conference (CAS)
Publisher:
IEEE
Date of publication:
09.10.2024
Year:
2024
Fulltext / DOI:
doi:10.1109/cas62834.2024.10736762
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