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Document type:
Konferenzbeitrag 
Author(s):
Borthen, P.; Wachutka, G. 
Title:
"Testing semiconductor devices at extremly high operating temperatures" 
Book / Congress title:
Proceedings of the 19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF - 
Congress (additional information):
Sept. 29 to Oct. 2, 2008, Maastricht, The Netherlands 
Year:
2008 
Reviewed:
ja 
Language:
en 
Publication format:
CD-ROM / DVD 
Semester:
SS 08 
Format:
Text