User: Guest  Login
Document type:
Zeitschriftenaufsatz
Author(s):
Faust, T.; Rieger, Seitner, M.J.; J.; Kotthaus, J.P.; Weig, E.M.
Title:
Signatures of two-level defects in the temperature-dependent damping of nanomechanical silicon nitride resonators
Abstract:
The damping rates of high quality factor nanomechanical resonators are well beyond intrinsic limits. Here,we explore the underlying microscopic loss mechanisms by investigating the temperature-dependent dampingof the fundamental and third harmonic transverse flexural mode of a doubly clamped silicon nitride string. Itexhibits characteristic maxima reminiscent of two-level defects typical for amorphous materials. Coupling tothose defects relaxes the momentum selection rules, allowing energy trans...     »
Dewey Decimal Classification:
010 Bibliografien
Journal title:
PHYSICAL REVIEW B89, 100102(R) 2014-03
Year:
2014
Year / month:
2014-03
Quarter:
1. Quartal
Month:
Mar
Language:
en
Fulltext / DOI:
doi:10.1103/PhysRevB.89.100102
WWW:
https://journals.aps.org/prb/abstract/10.1103/PhysRevB.89.100102
Publisher:
American Physical Society APS
 BibTeX