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Author(s):
Aryan, N. P.; Funke, C.; Barsgfrede, J.; Yilmaz, C.; Schmitt-Landsiedel, D.; Georgakos, G. 
Title:
{I}n situ measurement of aging-induced performance degradation in digital circuits 
Keywords:
circuit reliability; digital circuits; time-digital conversion; timing; PVTA; TDC; aging induced performance degradation; aging mechanisms; circuit reliability status; digital circuits; functional failure; functional paths; in situ timing monitors; intra-die variations; measurement data analysis; process voltage temperature and aging; time to digital converter; timing behavior; timing properties; timing violations; Aging; Monitoring; Stress; Stress measurement; Temperature measurement; Temperatu...    »
 
Book / Congress title:
2016 21th IEEE European Test Symposium (ETS) 
Year:
2016 
Month:
May 
Pages:
1-2