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Document type:
Zeitschriftenaufsatz 
Author(s):
Darwish, M.; Boysan, H.; Liewald, C.; Nickel, B.; Gagliardi, A. 
Title:
A resistor network simulation model for laser-scanning photo-current microscopy to quantify low conductance regions in organic thin films 
Abstract:
Organic field effect transistors (OFETs) show considerable variation from device to device and batch to batch. For the basic understanding of the microscopic origins of these variations, it is crucial to develop both experimental and theoretical methods that allow to localize ineffective regions in a device. Raster techniques, which manipulate conductivity locally, combined with global current readout may provide this information, e.g. it has been suggested that diffraction limited illumination...    »
 
Keywords:
OFETs SPCM Resistor networks Spot illumination Trap densities 
Journal title:
Organic Electronics Available online 7 August 2018 In Press, Accepted Manuscript 2018-08 
Year:
2018 
Year / month:
2018-08 
Quarter:
3. Quartal 
Month:
Aug 
Language:
en 
Publisher:
Elsevier B.V.