A method for the calculation of sensitivity and spatial resolution in electrooptic (EO) sampling is described. The method can be applied to an external EO probing tip and to direct probing in EO active substrates. The change in polarization and the resulting intensity variations of the reflected sampling beam after passing through a polarizer are determined using the volume-integral method, which yields a rigorous treatment of the influence of the electrical field and the optical beam. In the case of an external EO probe tip a layered structure with a space-harmonic potential is investigated in detail, and results on sensitivity and spatial resolution are presented.     «

A method for the calculation of sensitivity and spatial resolution in electrooptic (EO) sampling is described. The method can be applied to an external EO probing tip and to direct probing in EO active substrates. The change in polarization and the resulting intensity variations of the reflected sampling beam after passing through a polarizer are determined using the volume-integral method, which yields a rigorous treatment of the influence of the electrical field and the optical beam. In the ca...     »