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Document type:
Buchbeitrag
Author(s):
Andreas Herkersdorf, Michael Engel, Michael Glaß, Jörg Henkel, Veit B. Kleeberger, Johannes M. Kühn, Peter Marwedel, Daniel Mueller-Gritschneder, Sani R. Nassif, Semeen Rehman, Wolfgang Rosenstiel, Ulf Schlichtmann, Muhammad Shafique, Jürgen Teich, Norbert Wehn, Christian Weis
Title:
RAP Model—Enabling Cross-Layer Analysis and Optimization for System-on-Chip Resilience
Pages contribution:
pp 1-27
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book title:
Dependable Embedded Systems
Volume:
Part of the Embedded Systems book series (EMSY)
Publisher:
Springer
Year:
2021
Year / month:
2021-01
Print-ISBN:
978-3-030-52016-8
E-ISBN:
978-3-030-52017-5
Language:
en
DOI:
doi:https://doi.org/10.1007/978-3-030-52017-5_1
WWW:
https://link.springer.com/chapter/10.1007/978-3-030-52017-5_1
TUM Institution:
Lehrstuhl für Integrierte Systeme
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