In this paper, we describe a procedure for computer aided characterization of radiated emissions of printed circuit boards. Noisy electromagnetic fields are thereby modeled as Gaussian stochastic processes. From the auto- and crosscorrelation functions of the fields, sampled at different locations, we obtain the spectral energy density on a plane close above the device under test. Based on a characterization by field correlations, we can assess the impact of different parts of the printed circuit board on other parts of the system due to radiated EMI.     «

In this paper, we describe a procedure for computer aided characterization of radiated emissions of printed circuit boards. Noisy electromagnetic fields are thereby modeled as Gaussian stochastic processes. From the auto- and crosscorrelation functions of the fields, sampled at different locations, we obtain the spectral energy density on a plane close above the device under test. Based on a characterization by field correlations, we can assess the impact of different parts of the printed circui...     »