Battery-backed security enclosures that are permanently monitored for penetration and tampering are common solutions for providing physical integrity to multi-chip embedded systems. This paper presents a well-tailored measurement system for a batteryless PUFbased capacitive enclosure. The key is derived from the PUF and encrypts the underlying system. We present a system concept for combined enclosure integrity verification and PUF evaluation. The system performs differential capacitive measurements inside the enclosure by applying stimulus signals with a 180◦ phase shift that isolate the local variation in the femtofarad range. The analog circuitry and corresponding digital signal processing chain perform precise PUF digitization, using a microcontroller-based digital lockin amplifier. The system’s measurement range is approximately ±73 fF, the conversion time per PUF node is less than 0.6 ms, and the raw data shows a measurement noise of 0.3 fF. This is the base for a high-entropy key generation while enabling a short system startup time. The system is scalable to the enclosure size and has been experimentally verified to extract information from 128 PUF nodes, using a system prototype. The results show that our concept forms a cornerstone of a novel batteryless PUF-based security enclosure.      «

Battery-backed security enclosures that are permanently monitored for penetration and tampering are common solutions for providing physical integrity to multi-chip embedded systems. This paper presents a well-tailored measurement system for a batteryless PUFbased capacitive enclosure. The key is derived from the PUF and encrypts the underlying system. We present a system concept for combined enclosure integrity verification and PUF evaluation. The system performs differential capacitive measur...     »