Modern electronic devices, consisting of complex digital and analog circuitry may unintentionally radiate electromagnetic interference. Noisy electromagnetic fields can be characterized by their correlation spectra. In this work, we present a method, based on field-field correlations, for localizing equivalent dipole sources, from electromagnetic field data obtained by near-field scanning. From data sampled in a plane above the device under test, we calculate auto- and cross-correlation functions, representing the second order moments of the random process describing the electromagnetic field. By subsequent forming of ensemble averages and fast Fourier transform, we obtain auto- and cross-correlation spectra. We present a method for localizing equivalent dipoles, resembling the actual source distribution of the device under test.     «

Modern electronic devices, consisting of complex digital and analog circuitry may unintentionally radiate electromagnetic interference. Noisy electromagnetic fields can be characterized by their correlation spectra. In this work, we present a method, based on field-field correlations, for localizing equivalent dipole sources, from electromagnetic field data obtained by near-field scanning. From data sampled in a plane above the device under test, we calculate auto- and cross-correlation function...     »