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- Author(s):
- Stockmar, Marco; Zanette, Irene; Dierolf, Martin; Enders, Bjoern; Clare, Richard; Pfeiffer, Franz; Cloetens, Peter; Bonnin, Anne; Thibault, Pierre
- Title:
- X-Ray Near-Field Ptychography for Optically Thick Specimens
- Journal title:
- Physical Review Applied
- Year:
- 2015
- Journal volume:
- 3
- Journal issue:
- 1
- Fulltext / DOI:
- doi:10.1103/physrevapplied.3.014005
- Publisher:
- American Physical Society (APS)
- E-ISSN:
- 2331-7019
- Date of publication:
- 21.01.2015
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