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Document type:
Konferenzbeitrag 
Author(s):
Salzberger, M.; Nomayr, C.; Rutzinger, M.; Lugli, P.; Zimmermann, C.G. 
Title:
Using variable threshold displacement energy for degradation fitting of particle irradiated multi-junction space solar cells 
Abstract:
The degradation of Ga0.5In0.5P/GaAs/Ge triple junction 3G28, 3G30 and isotype 3G28 Ga0.5In0.5P and GaAs cells is analysed and the characteristic degradation curves are determined. The well established displacement damage method was applied in combination with a variable Td as a fitting parameter. The validity of the NIEL data analysis was verified by the reproduction of a Td of 21 eV for GaAs. The same method that has been published recently yields 36 eV for Ga0.5In0.5P single junction cells. Th...    »
 
Keywords:
threshold displacement energy, multi-junction solar cell, particle degradation 
Book / Congress title:
Photovoltaic Specialists Conference (PVSC), 2016 IEEE 43rd 
Congress (additional information):
05-10 June 2016, Portland OR USA 2016-06 
Publisher:
IEEE Xplore Digital Library 
Year:
2016 
Quarter:
2. Quartal 
Year / month:
2016-06 
Month:
Jun 
Language:
en