Multi-Probe Near-Field Measurement of Stochastic Noisy Radiations: Perspectives for Chip-Package (LNA}-Probe Co-Design

Wane, S.; Bajon, D.; Lesenechal, D.; Russer, J.A.; Thomas, D.; Russer, P.

Document type:: Konferenzbeitrag
Author(s):: Wane, S.; Bajon, D.; Lesenechal, D.; Russer, J.A.; Thomas, D.; Russer, P.
Title:: Multi-Probe Near-Field Measurement of Stochastic Noisy Radiations: Perspectives for Chip-Package (LNA}-Probe Co-Design
Book / Congress title:: Proc. European Microwave Conference (EuMC) 2016-10
Congress (additional information):: London, United Kingdom, 03-07 Oct 2016
Year:: 2016
Quarter:: 4. Quartal
Year / month:: 2016-10
Month:: Oct
Reviewed:: ja
Language:: en
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