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Document type:
Konferenzbeitrag 
Author(s):
Wane, S.; Bajon, D.; Lesenechal, D.; Russer, J.A.; Thomas, D.; Russer, P. 
Title:
Multi-Probe Near-Field Measurement of Stochastic Noisy Radiations: Perspectives for Chip-Package (LNA}-Probe Co-Design 
Book / Congress title:
Proc. European Microwave Conference (EuMC) 2016-10 
Congress (additional information):
London, United Kingdom, 03-07 Oct 2016 
Year:
2016 
Quarter:
4. Quartal 
Year / month:
2016-10 
Month:
Oct 
Reviewed:
ja 
Language:
en