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Author(s):
Pfeiffer, Franz; Zhang, Wei; Robinson, Ian K.
Title:
Coherent grazing exit x-ray scattering geometry for probing the structure of thin films
Journal title:
Appl. Phys. Lett.
Year:
2004
Journal volume:
84
Journal issue:
11
Pages contribution:
1847
Fulltext / DOI:
doi:10.1063/1.1669061
Publisher:
AIP Publishing
Date of publication:
01.01.2004
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