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- Author(s):
- Kewish, Cameron M.; Thibault, Pierre; Dierolf, Martin; Bunk, Oliver; Menzel, Andreas; Vila-Comamala, Joan; Jefimovs, Konstantins; Pfeiffer, Franz
- Title:
- Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics
- Journal title:
- Ultramicroscopy
- Year:
- 2010
- Journal volume:
- 110
- Pages contribution:
- 325-329
- Fulltext / DOI:
- doi:10.1016/j.ultramic.2010.01.004
- Publisher:
- Elsevier BV
- Date of publication:
- 01.03.2010
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