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Document type:
Konferenzbeitrag
Author(s):
Erol Koser, Walter Stechele
Title:
Tackling Long Duration Transients in Sequential Logic
Keywords:
RELY
Dewey Decimal Classification:
620 Ingenieurwissenschaften
Book / Congress title:
IEEE Int. Symp. on On-Line Testing and Robust System Design (IOLTS) 2016
Date of congress:
July 4-6
Year:
2016
Year / month:
2016-07
TUM Institution:
Lehrstuhl für Integrierte Systeme
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